ZEISS Xradia Context is a large field-of-view, non-destructive 3D X-ray micro-computed tomography system with a robust stage and flexible software-controlled source/detector positioning.
![](http://mentel.co.th/th/wp-content/uploads/2021/04/Xradia-Context-microCT-นอน.jpg)
ZEISS Xradia Context is a large field-of-view, non-destructive 3D X-ray micro-computed tomography system. With a robust stage and flexible software-controlled source/detector positioning, you can image large, heavy (25 kg), and tall samples in their full 3D context, as well as small samples with high resolution and detail.
✓ Obtain 3D data on entire intact electronic components, large raw materials samples, or biological specimens.
✓ Perform non-destructive failure analysis to identify internal defects without cutting your sample or workpiece.
✓ Characterize and quantify performance-defining heterogeneities in your materials, like porosity, cracks, inclusions, defects, or multiple phases.
✓ Perform 4D evolutionary studies, through ex situ treatment or in situ sample manipulation.
✓ Connect to the ZEISS correlative microscopy environment and perform nondestructive 3D imaging to identify regions of interest for subsequent high resolution 2D or 3D electron microscopy imaging.
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Full context 3D imaging
✓ Resolve fine details in their full 3D context, even within a relatively large imaging volume with a high pixel density detector of six megapixels.
✓ Maximize geometric magnification with small samples to identify and characterize micron-scale structures with high contrast and clarity.
✓ Mount and align your specimens rapidly or expand your system with an optional Autoloader for automated handling and sequential scanning of up to 14 samples.
✓ Take advantage of a streamlined acquisition workflow fast exposure times and data reconstruction.
✓ Achieve up to 10X faster with image quality
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Based on proven Xradia platform
✓ With Xradia context microCT you benefit of years of development as it is built upon the same base platform as the Xradia Versa series.
✓ Profit from a system targeted at ensuring stability, advances in high resolution, high quality data acquisition and reconstruction.
✓ The user-friendly Scout-and-Scan control system provides you with an efficient workflow environment.
✓ Perform 4D studies to measure changes in the microstructure of materials under varying conditions.
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Convertible to X-ray microscopy (XRM)
✓ As your imaging needs evolve, so should your instrument: Xradia Context now joins the ZEISS X-ray imaging portfolio, benefiting from ZEISS’s ongoing commitment to extend the capabilities and functionality of its systems in the field.
✓ This opens up 3D tomographic imaging that’s ready to grow with your needs – Your Xradia Context microCT is the only microCT that can be converted at any time to a ZEISS Xradia 5XX Versa 3D X-ray microscope (XRM).
✓ Add the in situ Interface Kit and load stages to investigate material evolution in 4D.
✓ Add FPX (flat panel extension) for flexibility and performance in spatial resolution and advanced contrast and acquisition methods.
![](http://mentel.co.th/th/wp-content/uploads/2021/04/spec-1-scaled.jpg)
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